Structured Illumination Super-Resolution Microscope System – Nikon N-SIM



The system uses Structured Illumination technology, which gives a two-fold enhancement in resolution (over conventional optical microscopy). Has ability to image dynamic events in live samples in both 2D, 3D and TIRF-SIM (higher signal-to-noise to enhance resolution even further). Includes top of the line super-resolution and TIRF objectives (100X) have superior optics with the least amount of lens defects/aberrations. A wide-ranging illumination and detection systems to give users greater flexibility.
Key features include:
6 laser lines	Objectives
405 nm LD 20 mW 445 nm LD 20 mW 488 nm DPSS 70mW 514 nm DPSS 20 mW 561 nm DPSS 70mW 647 nm LD 125 mW	CFI PLAN APO LAMBDA 10X CFI PLAN APO LAMBDA 20X CFI HP APO TIRF AC 100X OIL